journal article·2007-09

Optimization of high-frequency magnetic force microscopy by ferrite-coated cantilevers

J.D. Wei, M. Kirsch, M.R. Koblischka, U. Hartmann

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Abstract

Abstract High-frequency magnetic force microscopy (HF-MFM) is, e.g., employed for the analyses of harddisk write heads. To improve the performance of HF-MFM, we developed and analyzed cantilevers coated by (Ni, Zn) ferrites. The magnetic coatings were prepared by RF sputtering with a typical thickness of 50 nm. We systematically compared the HF-MFM images of harddisk write heads obtained by ferrite- and CoCr-coated cantilevers. The ferrite-coated cantilevers were found to produce increased HF-MFM signals up to the GHz regime, whereas the contrast in the images taken by the conventional CoCr-coated cantilevers appear to be strongly reduced at frequencies above 400 MHz. The improvement of the HF-MFM performance due to the ferrite-coated cantilevers is discussed by considering the specific imaging mechanism.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Near-Field Optical Microscopy

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