Direct method for magnetostriction coefficient measurement based on atomic force microscope, illustrated by the example of Tb–Co film
Source abstract
Abstract
Abstract This paper presents a method based on the Atomic Force Microscopy technique for direct measurement of magnetostriction coefficient of amorphous Tb–Co films deposited on Si(100) substrate. The magnetostriction coefficient of the film is determined by AFM measuring the deflection of the sample when applying a magnetic field. In order to maximize the deflection of the sample, in-plane magnetic anisotropy was induced by heat treatment under a magnetic field of 5 kOe. The value obtained for the saturation magnetostriction is 204×10 −6 for the Tb 23 Co 77 film.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Magnetic Properties and Applications · Magnetic properties of thin films · Force Microscopy Techniques and Applications
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References (15)
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