Playback performance and microstructure of sputtered tape media formed by facing targets sputtering
Source abstract
Abstract
Abstract Sputtered tape media of a CoPtCr–SiO 2 magnetic layer with a Ru underlayer was fabricated on a thin Aramid film by a facing targets sputtering (FTS) system at room temperature with no cooling. Transition electron microscope (TEM) images show columnar epitaxial growth of hcp -CoPtCr(1 0 0) plane on hcp -Ru(1 0 0). Average grain diameter of 10.2 nm with dispersion of 20.2% was obtained from TEM images. Enrichment of Co and Pt inside grains and segregation of Cr and Si to boundary were confirmed by point energy dispersive spectroscopy (EDS) measurements. Playback performance test on sputtered sample indicated that SNR is higher and PW50 value is lower than that of commercial coated tapes. These good playback properties could come from fine and isolated grain structure of magnetic layer of sputtered sample, as observed by TEM.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Magnetic properties of thin films · ZnO doping and properties · Copper Interconnects and Reliability
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
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