Magnetic resonance force microscopy studies in a thin permalloy film

Abstract A 50 nm thick Permalloy film has been studied using magnetic resonance force microscopy (MRFM). The ferromagnetic resonance signal has been mechanically detected utilizing a cantilever with a Nd 2 Fe 14 B tip. The measurements were performed in the temperature range between 10 and 70 K and a DC field applied perpendicular to the surface of the film. The microwave field was in the plane. The measurements indicate a decrease of the ferromagnetic resonance field with increasing temperature which may be attributed to temperature-dependent changes of the saturation magnetization. The measurements demonstrate the capability of MRFM to study temperature-dependent phenomena.