Low power RF sputter deposition of oriented copper ferrite films

Abstract Thin copper ferrite films have been deposited on amorphous quartz substrates. The films are annealed in air and either quenched in liquid nitrogen or slow cooled from the annealing temperature. The quenched as well as slow cooled films, show (1 1 1) peaks of copper ferrite along with the (3 1 1) peak. This indicates strong (1 1 1) orientation of the films. From the MH loops, squareness value ( M R / M S ) has been calculated for both type of films. The squareness value of the parallel MH loop is double the value of the perpendicular MH loop.