Rigorous method to solute the slit diffraction
Source abstract
Abstract
The authors present a semianalytical method to rigorous solute the slit diffraction in this paper, and it can be used to calculate the field located at an arbitrary depth of the diffraction zone. And some expressions of the diffraction field in the double-slit are also given. Finally, the space distribution of the diffraction field located at three transmission depths was numerically calculated.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Optical Coatings and Gratings · Photonic Crystals and Applications · Microwave Engineering and Waveguides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
College of Nuclear Science and Engineering, Sichuan University , Chengdu, Sichuan 86610064, China
References (24)
Show source-provided references
1. 1997
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