journal article·2011-12

Structure and properties of Ti–Al–Y–N coatings deposited from filtered vacuum-arc plasma

V.A. Belous, V.V. Vasyliev, V.S. Goltvyanytsya, S.K. Goltvyanytsya, A.A. Luchaninov, E.N. Reshetnyak, V.E. Strel'nitskij, G.N. Tolmacheva, O. Danylina

Surface and Coatings Technology· Volume 206· Issue 7
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Abstract

Abstract Ti 0.5 Al 0.5 N coatings with a small amount of Y (up to 1 at.%) were deposited by filtered vacuum arc plasma at pulsed high voltage negative substrate bias potential with amplitude up to 2.5 kV and their microstructure was studied. X-ray fluorescence analysis showed that this deposition method allows ensuring well the conformity of the elemental composition of the metallic components of cathodes and films. X-ray diffraction measurements of the films with yttrium revealed a solid solution (Ti,Al)N phase with a cubic NaCl-type structure as the only crystalline phase. The films deposited with an amplitude of the substrate bias potential in the range of 1–1.5 kV were characterized by a strong axial texture [110]. In these films an increase of the yttrium content leads to the reduction of the nitride lattice parameter and growth of coherent scattering zone dimension as well as to a decrease of the surface roughness. Coatings containing 1 at.% Y exhibited high hardness of 32–36 GPa and oxidation resistance.
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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Diamond and Carbon-based Materials Research · Semiconductor materials and devices

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