Dynamics of Piezoelectric Smart Beams Using a Three-Parameter Elastic Foundation Model

Piezoelectric patches are usually externally bonded to host structures as sensors and/or actuators. The performance and integrity of this type of smart structures are determined by the interface stresses within the adhesive layer. In this study, the dynamic behavior of a piezoelectric smart beam is analyzed using a novel three-parameter elastic foundation model. Closed-form solutions of the deformations, interfacial stresses, strain transfer, and sensing charge output are obtained. The new interfacial stress solutions overcome the inherent shortcomings in the existing two-parameter elastic foundation model by not only satisfying the zero shear stress boundary condition at the free edge, but also correctly predicting two different peeling stress distributions along the piezoelectric patch/adhesive interface and the host beam/adhesive interface. When the thick adhesive layer is used, the present three-parameter elastic foundation model exhibits high accuracy; while the existing two-parameter elastic foundation model significantly overestimates the response of the smart beam.