Progress in the study of electrorheological polishing: A review
Source abstract
Abstract
Electrorheological polishing (ERP) is an important field-assisted polishing method, which can reduce abrasive loss and improve machining efficiency by using the electric field-induced electrorheological (ER) effect to help the abrasive to overcome the centrifugal force caused by high rotating speed during polishing. ERP has many advantages, including high efficiency, high precision, facile polishing for a small object, and a good application prospect in polishing optical devices and hard molds. This review describes the research progress in ERP in the past two decades. The mechanism of electrorheological polishing is analyzed from two aspects of electrorheological effect and dielectrophoresis. According to the time sequence of electrorheological polishing development, two kinds of ERP materials including the simple mixing system and composite particle system are introduced. ERP electrodes including off-axis bipolar electrode, needle-ring electrode, needle-like single electrode, one-sided patterned electrode, and one-sided simple composite electrode are described. From the two characterization quantities of removal rate and surface quality, the industrial factors affecting the ERP effect are discussed. The advantages and disadvantages of ERP and other polishing processes are compared. Finally, the remaining challenges and possible development trends in ERP technology for the future outlook are proposed.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Tunneling and Rock Mechanics · Force Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Research and Development Institute of Northwestern Polytechnical University in Shenzhen, Shenzhen, Guangdong, China
Smart Materials Laboratory, Department of Applied Physics, School of Physical Science and Technology, Northwestern Polytechnical University, Xi’an, Shaanxi, China
References (100+)
Show source-provided references
1. 10.1177/1045389X980090081510.1177/1045389X9800900815 ↗
2. 10.1106/G4QQ-16G6-CKLR-XWUC10.1106/G4QQ-16G6-CKLR-XWUC ↗
3. 10.1016/j.wear.2005.04.02710.1016/j.wear.2005.04.027 ↗
4. 10.1111/j.1601-5037.2007.00265.x10.1111/j.1601-5037.2007.00265.x ↗
5. 10.1016/0010-938X(84)90039-810.1016/0010-938X(84)90039-8 ↗
6. 10.1088/0508-3443/13/10/32110.1088/0508-3443/13/10/321 ↗
7. 10.4028/www.scientific.net/KEM.304-305.18110.4028/www.scientific.net/KEM.304-305.181 ↗
8. 10.1122/1.55034310.1122/1.550343 ↗
9. 10.2113/gsecongeo.60.3.63010.2113/gsecongeo.60.3.630 ↗
10. 10.1016/0042-207X(93)90174-910.1016/0042-207X(93)90174-9 ↗
11. 10.1007/s12200-011-0183-410.1007/s12200-011-0183-4 ↗
12. 10.1007/s12200-014-0401-y10.1007/s12200-014-0401-y ↗
13. 10.1166/nnl.2011.122910.1166/nnl.2011.1229 ↗
14. 10.1088/1361-665X/ac547810.1088/1361-665X/ac5478 ↗
15. 10.1364/OE.22.02009410.1364/OE.22.020094 ↗
16. 10.1016/0022-3093(90)90200-610.1016/0022-3093(90)90200-6 ↗
17. 10.1177/1045389X930040021510.1177/1045389X9300400215 ↗
18. 10.1177/095440541453948810.1177/0954405414539488 ↗
19. Ding J · Recent Patents on Materials Science · 2011 · 4 · 43
20. 10.1122/1.55018410.1122/1.550184 ↗
21. 10.1063/1.170725710.1063/1.1707257 ↗
22. 10.1063/1.171273810.1063/1.1712738 ↗
23. 10.1364/AO.37.00677110.1364/AO.37.006771 ↗
24. 10.3390/mi1210123510.3390/mi12101235 ↗
25. 10.1016/j.jmatprotec.2022.11758910.1016/j.jmatprotec.2022.117589 ↗
26. 10.1115/MNC2007-2114410.1115/MNC2007-21144 ↗
27. 10.1177/1045389X1667256810.1177/1045389X16672568 ↗
28. 10.1007/978-1-4899-1036-3_210.1007/978-1-4899-1036-3_2 ↗
29. 10.1177/1045389X1142836510.1177/1045389X11428365 ↗
30. 10.1016/j.jmatprotec.2018.09.02410.1016/j.jmatprotec.2018.09.024 ↗
31. Haobo C · Proceedings of SPIE · 2009
32. 10.1117/12.13078010.1117/12.130780 ↗
33. 10.1177/1045389X1773091210.1177/1045389X17730912 ↗
34. 10.1177/1045389X22108802810.1177/1045389X221088028 ↗
35. 10.4028/www.scientific.net/AMR.126-128.52710.4028/www.scientific.net/AMR.126-128.527 ↗
36. 10.3389/fmats.2022.105384710.3389/fmats.2022.1053847 ↗
37. 10.1088/0964-1726/5/5/00910.1088/0964-1726/5/5/009 ↗
38. 10.4028/www.scientific.net/AMR.76-78.31910.4028/www.scientific.net/AMR.76-78.319 ↗
39. 10.1504/IJMTM.2006.00998910.1504/IJMTM.2006.009989 ↗
40. 10.1299/jsmelem.2005.2.87110.1299/jsmelem.2005.2.871 ↗
41. 10.4028/www.scientific.net/KEM.329.21310.4028/www.scientific.net/KEM.329.213 ↗
42. 10.2493/jjspe.59.55910.2493/jjspe.59.559 ↗
43. 10.1142/S021797920503076110.1142/S0217979205030761 ↗
44. 10.1016/S0890-6955(02)00143-810.1016/S0890-6955(02)00143-8 ↗
45. 10.1016/j.jmatprotec.2004.04.23910.1016/j.jmatprotec.2004.04.239 ↗
46. 10.1177/1045389X0708313910.1177/1045389X07083139 ↗
47. 10.1007/s11465-019-0535-010.1007/s11465-019-0535-0 ↗
48. 10.1016/S0141-6359(02)00112-510.1016/S0141-6359(02)00112-5 ↗
49. 10.2493/jjspe.65.14510.2493/jjspe.65.145 ↗
50. 10.1364/OFT.2004.XWA110.1364/OFT.2004.XWA1 ↗
51. 10.4028/www.scientific.net/KEM.257-258.47710.4028/www.scientific.net/KEM.257-258.477 ↗
52. 10.1007/s12200-011-0170-910.1007/s12200-011-0170-9 ↗
53. 10.1007/s00170-022-08838-510.1007/s00170-022-08838-5 ↗
54. 10.1016/j.jmatprotec.2008.10.05910.1016/j.jmatprotec.2008.10.059 ↗
55. 10.4028/www.scientific.net/AMR.135.2410.4028/www.scientific.net/AMR.135.24 ↗
56. 10.1109/66.92072310.1109/66.920723 ↗
57. 10.1177/1045389X21101166010.1177/1045389X211011660 ↗
58. 10.1364/AO.19.00232910.1364/AO.19.002329 ↗
59. 10.1016/0021-9673(75)85029-110.1016/0021-9673(75)85029-1 ↗
60. 10.1016/S0924-0136(03)00410-210.1016/S0924-0136(03)00410-2 ↗
61. 10.1109/66.47517910.1109/66.475179 ↗
62. 10.1115/FEDSM2007-3719110.1115/FEDSM2007-37191 ↗
63. 10.1177/1045389X2095125910.1177/1045389X20951259 ↗
64. 10.1177/1045389X2093009510.1177/1045389X20930095 ↗
65. 10.1063/1.345662610.1063/1.3456626 ↗
66. 10.1149/1.205498510.1149/1.2054985 ↗
67. 10.1016/j.diamond.2012.11.00710.1016/j.diamond.2012.11.007 ↗
68. 10.1134/1.144863010.1134/1.1448630 ↗
69. 10.1364/AO.55.00063810.1364/AO.55.000638 ↗
70. 10.1016/j.jmatprotec.2016.07.01910.1016/j.jmatprotec.2016.07.019 ↗
71. 10.1016/j.cirp.2010.03.11710.1016/j.cirp.2010.03.117 ↗
72. 10.4028/www.scientific.net/KEM.329.20110.4028/www.scientific.net/KEM.329.201 ↗
73. 10.4028/www.scientific.net/KEM.404.12310.4028/www.scientific.net/KEM.404.123 ↗
74. 10.1504/IJAT.2009.02163910.1504/IJAT.2009.021639 ↗
75. Temmler A · Proceedings of SPIE · 2012 · 8243 · 19
76. 10.1007/s00170-016-8527-210.1007/s00170-016-8527-2 ↗
77. 10.1016/j.jmatprotec.2007.11.15010.1016/j.jmatprotec.2007.11.150 ↗
78. 10.1007/BF0054035710.1007/BF00540357 ↗
79. 10.1149/1.277799610.1149/1.2777996 ↗
80. 10.1016/j.precisioneng.2022.04.00310.1016/j.precisioneng.2022.04.003 ↗
81. 10.1016/j.precisioneng.2021.09.01010.1016/j.precisioneng.2021.09.010 ↗
82. 10.1016/j.jmatprotec.2019.11655210.1016/j.jmatprotec.2019.116552 ↗
83. 10.1016/j.ijmachtools.2016.12.00610.1016/j.ijmachtools.2016.12.006 ↗
84. 10.1021/acsapm.1c0102110.1021/acsapm.1c01021 ↗
85. 10.1177/1045389X22109945710.1177/1045389X221099457 ↗
86. 10.4028/www.scientific.net/AMM.602-605.31610.4028/www.scientific.net/AMM.602-605.316 ↗
87. 10.1063/1.171397010.1063/1.1713970 ↗
88. 10.1016/S0043-1648(96)07275-410.1016/S0043-1648(96)07275-4 ↗
89. 10.1177/1045389X1769824710.1177/1045389X17698247 ↗
90. 10.1177/1045389X1983596010.1177/1045389X19835960 ↗
91. 10.1364/AO.56.00982210.1364/AO.56.009822 ↗
92. 10.1177/1045389X1769205010.1177/1045389X17692050 ↗
93. 10.4028/www.scientific.net/KEM.315-316.35210.4028/www.scientific.net/KEM.315-316.352 ↗
94. 10.1016/j.ceramint.2021.08.04710.1016/j.ceramint.2021.08.047 ↗
95. 10.1504/IJNM.2011.04247710.1504/IJNM.2011.042477 ↗
96. 10.4028/www.scientific.net/AMR.314-316.113110.4028/www.scientific.net/AMR.314-316.1131 ↗
97. 10.1016/j.ijmachtools.2010.04.00310.1016/j.ijmachtools.2010.04.003 ↗
98. 10.1016/j.ijmachtools.2005.01.02110.1016/j.ijmachtools.2005.01.021 ↗
99. 10.1016/j.ijmachtools.2007.10.01110.1016/j.ijmachtools.2007.10.011 ↗
100. 10.1007/s00170-019-03580-x10.1007/s00170-019-03580-x ↗