High-throughput Microstructural Characterization of xSi-BN Coated SiC Fibers by Combining Scanning Electron Microscopy and Laser Scanning Confocal Microscopy
Source abstract
Abstract
xSi-BN/SiCin" 14.91 GPa 8.06 GPa Si 11% 32
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Silicon Carbide Semiconductor Technologies · Advanced ceramic materials synthesis · Boron and Carbon Nanomaterials Research
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References
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