DataVXJournal of Inorganic MaterialsPaper
journal article·2018Open access

Characterization and Electrical Property of Impurity Concentration in Ge-N Codoped SiC Crystals

LI Tian, CHEN Xiu-Fang, YANG Xiang-Long, XIE Xue-Jian, ZHANG Fu-Sheng, XIAO Long-Fei, WANG Rong-Kun, XU Xian-Gang, HU Xiao-Bo, WANG Rui-Qi, YU Peng

Journal of Inorganic Materials· Volume 33· Issue 5
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Abstract

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Research context

OpenAlex topics: Silicon Carbide Semiconductor Technologies · Semiconductor materials and interfaces · Semiconductor materials and devices

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