article·1997-01-01

Quantitative Phase Abundance in Yttria-Stabilize Zirconia by Rietveld Analysis

Wang Peilin

Abstract

Based on the relation between the phase contents in a multiphase powder and their corresponding scale factors in Rietveld refinements, the phase abundance of multiphase material could be quantitatively obtained[1]. The results of quantitative phase analysis of Y2O3-doped ZrO2 specimens using Rietveld technique and X-ray diffraction data of profile intensities were given. The effect of grinding on the transformation of tetragonal to monoclinic ZrO2 was a1so confirmed.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: X-ray Diffraction in Crystallography · Machine Learning in Materials Science · Zeolite Catalysis and Synthesis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.