article·2001-01-01

Spectroscopic Ellipsometry Studies of Ba_(0.9)Sr_(0.1)Ti0_3 Thin Films

Yang Sheng

Abstract

Ellipsometric spectra of Bo0.9Sr0.1TiO3 (BST) thin films with various annealing temperatures were measured in the range of photon energy from 2.1 to 5.2eV. Constructing appropriate fitting models and describing optical properties of the BST with Cauchy dispersion model, their optical constants (refractive index n and extinction coefficient κ) spectra and band gap Eg were determined by means of an optimization. Compared these results, we obtained the variation of the refractive index n, the extinction coefficient κand the band gap Eg with annealing temperatures.
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Research context

OpenAlex topics: Ferroelectric and Piezoelectric Materials · Microwave Dielectric Ceramics Synthesis · Electronic and Structural Properties of Oxides

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