Regression Analysis of the Relationship between Dielectric Properties and Processing Parameters of (Zr_0.7Sn_0.3)TiO_4 Ceramics

Regression analysis was used to obtain the quantitative relationship between the dielectric properties (e and tanδ) and processing parameters of (Zr0.7Sn0.3)Ti04 ceramics, which include doping rates of CuO, ZnO and glass (x1, x2 and x3 wt%, respectively), the calcination and sintering (0:4 ×103 and x5×l03℃, respectively) temperatures: e= 10.9731-1.4559x1 + 9.9154x2 + 1.9776x3 - 3.3160x33- 0.2286x23 - 200.1697x24 - 161.9102x25 + 375.1160x4x5; 1g(tanδ) = -38.5876 -0.6452x2 + 0.1235x3 + 31.2221x4 + 30.3861x5 + 0.1100x21 + 0.2077x22 - 0.0106x23 - 27.4317x4x5. It is possible to predict the dielectric properties under given processing parameters, and to determine the processing parameters that satisfy certain dielectric properties. This helps to accelerate the investigation of electric ceramic materials.