Effect of Rapid Thermal Annealing on Structural and Electrical Characteristics of Ni-Al-O Gate Dielectrics
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OpenAlex topics: Semiconductor materials and devices · Advanced Memory and Neural Computing · Semiconductor materials and interfaces
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References (15)
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3. Wilk G D10.1063/1.1361065 ↗
4. Lin Y H10.1063/1.1827937 ↗
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6. Wang S J10.1088/0268-1242/18/2/316 ↗
7. null
8. Liu B T
9. Selçuk A B
10. Thomas R10.1063/1.366181 ↗
11. Liu B T
12. Song X F10.1016/j.mee.2009.03.036 ↗
13. Auciello O
14. Guo Y N10.1149/1.3365060 ↗
15. Chuang K C