journal article·2020Open access

Molecular Dynamics Analysis of Chemical Disorders Induced by Irradiated Point Defects in 6H-SiC

ZHANG Xiuyu, CHEN Xiaofei, WANG Hao, GUO Xun, XUE Jianming

Journal of Inorganic Materials· Volume 35· Issue 8

Abstract

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Research context

OpenAlex topics: Silicon Carbide Semiconductor Technologies · Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis

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Affiliations

1. State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871, China;

2. China Institute of Nuclear Information and Economics, Beijing 100048, China;

References (29)

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