Stacking Faults in 4H-SiC Single Crystal
Source abstract
Abstract
(1. 北京天科合达半导体股份有限公司, 北京 102600; 2. 新疆天科合达蓝光半导体有限公司, 石河子 832000)
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Silicon Carbide Semiconductor Technologies · Advanced ceramic materials synthesis · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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