Alumina Thin Film Coated Ammonium Dinitramide Fabricated by Atomic Layer Deposition
Source abstract
Abstract
: (ALD)(ADN) (SEM), X (XPS) ADN , (VSA) ADN , ADN : ALD ADN , ALD ADN 48 h 25, 70%, VSA 200 400 ADN 40.99% 40.75% , ALD ADN , ADN
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Semiconductor materials and devices · Catalytic Processes in Materials Science · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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