journal article·2013-10Open access

Relation between shielding effectiveness and tightness of electromagnetic shielding fabric

Zhe Liu, Xiuchen Wang

Journal of Industrial Textiles· Volume 43· Issue 2

Abstract

This article studies the relation between fabric tightness and shielding effectiveness (SE) of blended electromagnetic shielding fabric (BESF). The SE of different tightness BESFs is tested using a waveguide testing method. Experimental analyses show that the SE of BESF associates to the tightness linearly, the SEs of same tightness fabrics are consistent under same metal fiber contents, same weave types and different yarn linear densities condition, and the SEs of different type fabrics are inconsistent under same tightness, same metal fiber contents and same yarn densities condition. Moreover, a theory about the relation between the SE and the tightness determined by adjacent yarns states is proposed according to the electromagnetic theory. A number of computation equations about tightness boundary determination are given, which would provide reference for the BESF design, manufacture and testing.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Electromagnetic Compatibility and Measurements · Electromagnetic wave absorption materials · RFID technology advancements

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Fashion, Zhongyuan University of Technology, Zhengzhou, Henan, PR China

References (31)

Show source-provided references
1. Wang J · Rare Metal Mater Eng · 2011 · 40 · 1688
2. Zang XF · Chin J Radio Sci · 2011 · 26 · 25
3. Li FY · Cotton Text Technol · 2003 · 3 · 153
4. 10.1504/IJMIC.2010.03703210.1504/IJMIC.2010.037032 ↗
5. 10.1177/00405175040740010910.1177/004051750407400109 ↗
6. 10.1504/IJMPT.2004.00426810.1504/IJMPT.2004.004268 ↗
7. Rajendrakumar K · Indian J Fibre Text Res · 2012 · 37 · 133
8. Zhou FL · Cotton Text Technol · 2012 · 40 · 34
9. 10.1007/s12221-012-0063-610.1007/s12221-012-0063-6 ↗
10. 10.1080/0040500080199758710.1080/00405000801997587 ↗
11. 10.1177/073168440606057810.1177/0731684406060578 ↗
12. 10.1177/152808371142602110.1177/1528083711426021 ↗
13. 10.1007/s11664-012-2128-010.1007/s11664-012-2128-0 ↗
14. 10.1080/0040500090294536010.1080/00405000902945360 ↗
15. 10.1177/152808371038717610.1177/1528083710387176 ↗
16. 10.1177/152808370708783410.1177/1528083707087834 ↗
17. 10.1080/09205071.2012.71735210.1080/09205071.2012.717352 ↗
18. 10.1177/152808370935018610.1177/1528083709350186 ↗
19. 10.1177/00405175030730040810.1177/004051750307300408 ↗
20. 10.1177/152808370910331710.1177/1528083709103317 ↗
21. 10.1177/152808370708379410.1177/1528083707083794 ↗
22. 10.1177/00405175010710010710.1177/004051750107100107 ↗
23. 10.1109/15.70942210.1109/15.709422 ↗
24. Ahmed AA · Turkish J Electr Eng Comput Sci · 2011 · 19 · 119
25. 10.2528/PIERL1207120910.2528/PIERL12071209 ↗
26. Qian ZM
27. Gao C · High Volt Eng · 2010 · 9 · 2272
28. Pan ZY · Sci Technol Rev · 2009 · 27 · 86
29. Yang Y · Shanghai Text Sci Technol · 2004 · 32 · 58
30. ASTM D4935
31. Zhang J · Rare Metal Mater Eng · 2003 · 32 · 464