Corrigendum to “Inaccuracies in contact resistivity from the Cox–Strack method: A review” [Sol. Energy Mater. Sol. Cells 246 (2022) 111909]
Source abstract
Abstract
The authors regret to have incorrectly presented equation (7). In this equation, the given threshold value of 225 should be 900 to be in quantitative agreement with the referred article. As a consequence, in the final line of Table 2, the same criterion now leads to a slight correction: 57 passing versus 11 failing articles. In the Conclusion section the fourth line should therefore read: Another 11 articles suffer from spreading resistance in a conductive top layer. The authors would like to apologise for any inconvenience caused.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Semiconductor materials and interfaces · Integrated Circuits and Semiconductor Failure Analysis · Electronic Packaging and Soldering Technologies
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