journal article·2023-10Open access

Terahertz Spin Current Pulses in Antiferromagnetic Oxide: The Role of Vacancy‐Induced Ferromagnetism

Lei Zhang, Huaiwu Zhang, Dainan Zhang, Yuanpeng Li, Tianlong Wen, Zhiyong Zhong, Lichuan Jin

Small Structures· Volume 4· Issue 10

Abstract

Antiferromagnetic oxides have attracted increasing attention for their outstanding peculiarities in spintronics. Crystal lattice defects that are present in antiferromagnetic oxides can influence their physical properties, such as vacancy‐induced ferromagnetism. Meanwhile, the generation and manipulation of ultrafast spin currents of antiferromagnetic insulators are highly desired. Although the generation and detection of terahertz spin current pulses in antiferromagnetic oxides have been realized, the effect of vacancy‐induced ferromagnetism on spin current in antiferromagnetic oxides is not yet known. Herein, the role of vacancy‐induced ferromagnetism on the terahertz spin current in antiferromagnetic nickel oxide thin films is reported. Structural and magnetic characterizations reveal that nickel vacancies effectively break the strong antiferromagnetic exchange coupling, giving rise to the coexistence of antiferromagnetism and ferromagnetism in NiO thin films. Notably, the enhancement of terahertz radiation associated with the photo‐induced ultrafast spin current of NiO thin film with the strongest ferromagnetism is the most significant. Besides, the nonlinear susceptibility tensor parameters related to the antiferromagnetic property of NiO thin films also change distinctly. The findings indicate that the defects of antiferromagnetic materials play a decisive role in the application of antiferromagnetic spintronics in the terahertz field.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Magnetic properties of thin films · ZnO doping and properties · Magnetic and transport properties of perovskites and related materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

State Key Laboratory of Electronic Thin Films and Integrated Devices University of Electronic Science and Technology of China 2006 Xiyuan Avenue Chengdu Sichuan 611731 China

Funding

National Natural Science Foundation of China · National Key Scientific Instrument and Equipment Development Projects of China · Sichuan Province Science and Technology Support Program

References (58)

Show source-provided references
1. 10.1103/PhysRev.82.56510.1103/PhysRev.82.565 ↗
2. 10.1103/PhysRev.107.8410.1103/PhysRev.107.84 ↗
3. 10.1038/nphoton.2010.25910.1038/nphoton.2010.259 ↗
4. 10.1126/science.aab103110.1126/science.aab1031 ↗
5. 10.1103/RevModPhys.90.01500510.1103/RevModPhys.90.015005 ↗
6. 10.1038/s41567-018-0062-710.1038/s41567-018-0062-7 ↗
7. 10.1103/PhysRevB.78.01441310.1103/PhysRevB.78.014413 ↗
8. 10.1103/PhysRevLett.113.05760110.1103/PhysRevLett.113.057601 ↗
9. 10.1038/nmat285610.1038/nmat2856 ↗
10. 10.1103/PhysRevLett.116.09720410.1103/PhysRevLett.116.097204 ↗
11. 10.1002/adma.20220598810.1002/adma.202205988 ↗
12. 10.1038/s41586-020-1950-410.1038/s41586-020-1950-4 ↗
13. 10.1038/nphoton.2016.27410.1038/nphoton.2016.274 ↗
14. 10.1038/ncomms1072010.1038/ncomms10720 ↗
15. 10.1038/s41467-019-11961-910.1038/s41467-019-11961-9 ↗
16. 10.1103/PhysRevLett.120.20720710.1103/PhysRevLett.120.207207 ↗
17. 10.1038/s41567-018-0406-310.1038/s41567-018-0406-3 ↗
18. 10.1038/nnano.2013.4310.1038/nnano.2013.43 ↗
19. 10.1038/nphoton.2016.9110.1038/nphoton.2016.91 ↗
20. 10.1002/adma.20160303110.1002/adma.201603031 ↗
21. 10.1063/1.303980710.1063/1.3039807 ↗
22. 10.1016/j.jallcom.2011.03.08410.1016/j.jallcom.2011.03.084 ↗
23. 10.1038/nmat131010.1038/nmat1310 ↗
24. 10.1038/nmat392410.1038/nmat3924 ↗
25. 10.1126/sciadv.abj408610.1126/sciadv.abj4086 ↗
26. 10.1016/j.jmmm.2023.17042810.1016/j.jmmm.2023.170428 ↗
27. 10.1038/s41586-022-05461-y10.1038/s41586-022-05461-y ↗
28. 10.1038/s41928-022-00866-z10.1038/s41928-022-00866-z ↗
29. 10.1002/adma.20110343610.1002/adma.201103436 ↗
30. 10.1038/nnano.2013.4510.1038/nnano.2013.45 ↗
31. 10.1103/PhysRevLett.93.11740210.1103/PhysRevLett.93.117402 ↗
32. 10.1038/s41467-020-17925-810.1038/s41467-020-17925-8 ↗
33. 10.1103/PhysRevB.95.17440710.1103/PhysRevB.95.174407 ↗
34. 10.1038/s41567-020-01061-710.1038/s41567-020-01061-7 ↗
35. 10.1103/PhysRev.79.35010.1103/PhysRev.79.350 ↗
36. 10.1103/PhysRevB.98.13442210.1103/PhysRevB.98.134422 ↗
37. 10.1103/PhysRevLett.120.20720410.1103/PhysRevLett.120.207204 ↗
38. 10.1103/PhysRevLett.123.17720110.1103/PhysRevLett.123.177201 ↗
39. 10.1016/j.apsusc.2010.05.07110.1016/j.apsusc.2010.05.071 ↗
40. 10.1016/j.materresbull.2020.11086010.1016/j.materresbull.2020.110860 ↗
41. 10.1016/j.apsusc.2021.15068510.1016/j.apsusc.2021.150685 ↗
42. 10.1103/PhysRevB.4.230210.1103/PhysRevB.4.2302 ↗
43. 10.1088/1742-6596/93/1/01203910.1088/1742-6596/93/1/012039 ↗
44. 10.1088/1361-648X/ab9f0810.1088/1361-648X/ab9f08 ↗
45. 10.1021/jp050486b10.1021/jp050486b ↗
46. Sun Z. · ACS Appl. Mater. Interfaces · 2016 · 8 · 11573
47. 10.1016/j.physb.2014.06.03010.1016/j.physb.2014.06.030 ↗
48. 10.1063/5.010448010.1063/5.0104480 ↗
49. 10.1021/acsami.0c0349810.1021/acsami.0c03498 ↗
50. 10.1557/PROC-60-50710.1557/PROC-60-507 ↗
51. 10.1016/0168-9002(96)00075-710.1016/0168-9002(96)00075-7 ↗
52. 10.1103/PhysRevB.72.07533810.1103/PhysRevB.72.075338 ↗
53. 10.1103/PhysRevLett.87.13720210.1103/PhysRevLett.87.137202 ↗
54. 10.1103/PhysRevB.39.122910.1103/PhysRevB.39.1229 ↗
55. 10.1103/PhysRevB.74.14440110.1103/PhysRevB.74.144401 ↗
56. 10.1038/s41467-018-05135-210.1038/s41467-018-05135-2 ↗
57. 10.1103/PhysRevB.103.L20140410.1103/PhysRevB.103.L201404 ↗
58. 10.1103/RevModPhys.82.273110.1103/RevModPhys.82.2731 ↗