Defect‐Free P2‐Type Layered K x MnO 2 Cathode Material for Anode‐Free Potassium‐Ion Battery
Source abstract
Abstract
Potassium‐ion batteries (KIBs) require cathodes that combine structural robustness with fast K + transport and scalable manufacturing. Here, P2‐type KMO is developed using fast and efficient microwave heating process with controlled crystallite sizes (≈30–60 nm) and high crystallinity for Anode‐Free K‐ion batteries. In situ X‐ray powder diffraction (XRD) and Raman track reversible ‘breathing’ of the layered framework‐00l reflections shift smoothly to lower 2 θ on charge (c ≈ 12.6 → 12.8 Å) and return on discharge, with no persistent new phases‐evidence for mainly solid‐solution K + (de)intercalation. In K‐ion half‐cells, the cathode delivers 91.3 mAh g −1 with good rate capability; galvanostatic intermittent titration technique (GITT) (10 −11 –10 −9 cm 2 s −1 ) and electrochemical impedance spectroscopy (EIS) confirm favorable K + kinetics. Importantly, the material is further evaluated in an anode‐free K‐ion battery using carbon cloth as the current collector, achieving 83.5 mAh g −1 initially and 73.6% retention after 50 cycles with >99% Coulombic efficiency. The modest performance gap relative to half‐cells is attributed to limited K inventory and interfacial losses, indicating clear avenues for optimization. Microwave synthesis thus offers an efficient route to KMO compatible with both conventional and anode‐free operation.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Advancements in Battery Materials · Advanced battery technologies research · Advanced Battery Technologies Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Centre for Materials Science and School of Chemistry and Physics Queensland University of Technology Brisbane Australia
Multifunctional Materials Laboratory, Department of Physics Indian Institute of Technology Madras Chennai India
Central Analytical Research Facility Queensland University of Technology Brisbane Australia
References (49)
Show source-provided references
1. 10.1002/ente.20210008510.1002/ente.202100085 ↗
2. 10.1002/smll.20200270010.1002/smll.202002700 ↗
3. 10.1016/j.jpowsour.2019.22691310.1016/j.jpowsour.2019.226913 ↗
4. 10.1007/s10008-017-3610-710.1007/s10008-017-3610-7 ↗
5. 10.1007/s41918‐018‐0023‐y10.1007/s41918‐018‐0023‐y ↗
6. 10.1002/advs.20210588210.1002/advs.202105882 ↗
7. 10.3866/PKU.WHXB20230302110.3866/PKU.WHXB202303021 ↗
8. 10.1021/acsami.6b0798910.1021/acsami.6b07989 ↗
9. 10.1021/jacs.6b1218510.1021/jacs.6b12185 ↗
10. 10.1149/2.074311jes10.1149/2.074311jes ↗
11. 10.1002/aenm.20170009810.1002/aenm.201700098 ↗
12. 10.1002/smll.20230216010.1002/smll.202302160 ↗
13. 10.1002/batt.20220048610.1002/batt.202200486 ↗
14. 10.1002/adfm.20231314610.1002/adfm.202313146 ↗
15. 10.1002/anie.20251189910.1002/anie.202511899 ↗
16. 10.3866/PKU.WHXB20230300610.3866/PKU.WHXB202303006 ↗
17. 10.1088/1361‐6528/accfa210.1088/1361‐6528/accfa2 ↗
18. 10.1002/eem2.1206010.1002/eem2.12060 ↗
19. 10.1002/eem2.1216610.1002/eem2.12166 ↗
20. 10.1002/adma.20190006010.1002/adma.201900060 ↗
21. 10.1016/j.cej.2019.02.17210.1016/j.cej.2019.02.172 ↗
22. 10.1039/C9TA07837A10.1039/C9TA07837A ↗
23. 10.1002/aesr.20230019910.1002/aesr.202300199 ↗
24. 10.1109/TMTT.1984.113283110.1109/TMTT.1984.1132831 ↗
25. 10.1088/0022‐3727/34/13/20110.1088/0022‐3727/34/13/201 ↗
26. 10.1039/CS997260023310.1039/CS9972600233 ↗
27. 10.1016/j.nanoen.2021.10602710.1016/j.nanoen.2021.106027 ↗
28. 10.1002/adfm.20190567910.1002/adfm.201905679 ↗
29. 10.1039/C6NR04084E10.1039/C6NR04084E ↗
30. 10.1016/j.cej.2018.09.01210.1016/j.cej.2018.09.012 ↗
31. 10.1039/C7CC00806F10.1039/C7CC00806F ↗
32. 10.1021/acsenergylett.0c0091210.1021/acsenergylett.0c00912 ↗
33. 10.1016/j.nanoen.2019.04.06210.1016/j.nanoen.2019.04.062 ↗
34. 10.1016/j.est.2024.11304210.1016/j.est.2024.113042 ↗
35. International Centre for Diffraction Data (ICDD). PDF‐5+ Database Release accessed September 2025 https://www.icdd.com/.
36. 10.1002/zaac.1976420021110.1002/zaac.19764200211 ↗
37. 10.1007/s11581‐006‐0021‐710.1007/s11581‐006‐0021‐7 ↗
38. 10.1007/s11581‐022‐04627‐y10.1007/s11581‐022‐04627‐y ↗
39. National Institute of Standards and Technology (NIST). NIST X‐ray Photoelectron Spectroscopy (XPS) Database (SRD 20) Version 5.0. accessed August 2025 https://doi.org/https://srdata.nist.gov/xps/.
40. 10.1149/ma2019‐01/5/52110.1149/ma2019‐01/5/521 ↗
41. 10.1002/anie.20140451010.1002/anie.201404510 ↗
42. 10.1016/j.jpowsour.2016.04.11810.1016/j.jpowsour.2016.04.118 ↗
43. 10.1016/j.jpowsour.2019.02.06310.1016/j.jpowsour.2019.02.063 ↗
44. 10.1021/acsaem.3c0271910.1021/acsaem.3c02719 ↗
45. 10.1002/adfm.20110085410.1002/adfm.201100854 ↗
46. 10.1002/aenm.20170238410.1002/aenm.201702384 ↗
47. 10.1038/ncomms458510.1038/ncomms4585 ↗
48. 10.1016/S0013-4686(02)00102-010.1016/S0013-4686(02)00102-0 ↗
49. 10.1149/1.204866510.1149/1.2048665 ↗