journal article·2021-06-24Open access

VUV- and X-ray-induced Properties of Lu2Si2O7, Y2Si2O7, and Gd2Si2O7 Single Crystals

Prom Kantuptim, Hiroyuki Fukushima, Hiromi Kimura, Daisuke Nakauchi, Takumi Kato, Masanori Koshimizu, Noriaki Kawaguchi, Takayuki Yanagida

Sensors and Materials· Volume 33· Issue 6

Abstract

Undoped Lu 2 Si 2 O 7 (LPS), Y 2 Si 2 O 7 (YPS), and Gd 2 Si 2 O 7 (GPS) single crystals are prepared by the floating-zone (FZ) method. The X-ray diffraction (XRD) patterns show the single phase of each material without any impurity phases. The luminescence properties of the samples are investigated under both vacuum ultraviolet (VUV) and X-ray excitation. When the samples are excited by VUV photons, intrinsic emission bands at 350-500, 320-480, and 310 nm are observed for LPS, YPS, and GPS, respectively. The X-ray-induced scintillation spectra have a similar spectral shape to those under excitation by VUV photons. The X-ray induced scintillation decay times of LPS and YPS are 48 and 13 s, respectively. For GPS, two scintillation decay constants of 169 s and 1 ms are observed.
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Research context

OpenAlex topics: Nuclear materials and radiation effects · X-ray Diffraction in Crystallography · High-pressure geophysics and materials

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