journal article·2019-07-09Open access

Impact of Active Surface Area on Performance and Reliability of Tri-gate FinFET

Yi-Lin Yang, Chiao-Feng Chuang, Chih-Jui Lai, Wenqi Zhang, Yun-Hsuan Hsu, Chia-Jung Tsai, Wei-De Lin, Meng-Yen Lin, Wen-Kuan Yeh

Sensors and Materials· Volume 31· Issue 7

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OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Integrated Circuits and Semiconductor Failure Analysis

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