Observation of non-basal slip in Mg-Y by in situ three-dimensional X-ray diffraction

Abstract Mg-5wt%Y extruded alloy showed excellent tensile ductility along the extrusion direction. An in situ tensile test with three-dimensional X-ray diffraction (3DXRD) identified prismatic, basal, and pyramidal slip in different grains during deformation based on the analysis of grain rotation. Ex situ slip trace analysis using electron backscatter diffraction confirms the extensive activation of non-basal slip systems, which can explain the high ductility of this material. Critical resolved shear stress (CRSS) ratios between non-basal slip and basal slip are estimated from Schmid factor analysis.