Indium antimonide-strain induced by solder mounting in MBE
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Abstract
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Research context
OpenAlex topics: Advanced Semiconductor Detectors and Materials · Chalcogenide Semiconductor Thin Films · Solidification and crystal growth phenomena
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References (6)
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1. Farrow · Appl. Phys. Letters · 1981 · 39 · 95410.1063/1.92616 ↗
2. Wallace · J. Appl. Cryst. · 1975 · 8 · 4210.1107/S0021889875009491 ↗
3. MCP Electronics, Ltd., Wembley Middx UK.
4. Bell · J. Mater. Sci. · 1966 · 1 · 6610.1007/BF00549721 ↗
5. Hurle · J. Mater. Sci. · 1967 · 2 · 4610.1007/BF00550052 ↗
6. Ghez · J. Crystal Growth · 1981 · 52 · 69910.1016/0022-0248(81)90365-1 ↗