Observations of guinier-preston zones in an as-deposited Al-1wt.%Si-0.5wt.%Cu thin film
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Copper Interconnects and Reliability · Semiconductor materials and devices · Metal and Thin Film Mechanics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (17)
Show source-provided references
1. Starink · Materials Science and Engineering · 1992 · A156 · 18310.1016/0921-5093(92)90150-Y ↗
2. Starink · Metall. Trans. · 1991 · 22A · 66510.1007/BF02670289 ↗
3. Cohen · 1986 · Vol. 39 · 131
4. Lorimer · 1978 · 87
5. Westmacott · 1985 · 137
6. Saulnier · Mem. Sci. Rev. Metall. · 1961 · 58 · 615
7. Park · Appl. Phys. Lett. · 1994 · 64 · 72110.1063/1.111046 ↗
8. Colgan · J. of Appl. Phys. · 1994 · 75 · 342310.1063/1.356102 ↗
9. Kim · J. of Appl. Phys. · 1992 · 72 · 183710.1063/1.351655 ↗
10. Park · 1991 · Vol. 229 · 313
11. Frear · Metall. Trans · 1990 · 21A · 244910.1007/BF02646989 ↗
12. Venkatraman · J. of Elec. Mater · 1990 · 123110.1007/BF02673337 ↗
13. Transmission Electron Microscopy of Silicon VLSI Circuits and Structures
14. Phillips · Acta. Met. · 1973 · 21 · 44110.1016/0001-6160(73)90201-0 ↗
15. Theory of Structural Transformations in Solids
16. Micromechanics of Defects in Solids
17. Korhonen · J. Appl. Phys. · 1993 · 73 · 379010.1063/1.354073 ↗