Properties of Zig-zag nickel nanostructures obtained by glad technique
Source abstract
Abstract
Zig-zag structure of the nickel thin film has been obtained using Glancing Angle Deposition (GLAD) technique. Glass substrate was positioned 75 degrees with respect to the substrate normal. The obtained nickel thin film was characterized by X-ray Photoelectron Spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy. Surface energy of the deposited thin film was determined by measuring the contact angle using the static sessile drop method.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Optical Coatings and Gratings · Nanofabrication and Lithography Techniques · Surface Roughness and Optical Measurements
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Affiliations
INS Vinča, Laboratory of Atomic Physics, Belgrade
Faculty of Technology and Metallurgy, Belgrade
Funding
Ministry of Education, Science and Technological Development of the Republic of Serbia
References
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