Raman spectroscopy of optical properties in CdS thin films
Source abstract
Abstract
Properties of CdS thin films were investigated applying atomic force microscopy (AFM) and Raman spectroscopy. CdS thin films were prepared by using thermal evaporation technique under base pressure 2 x 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We apply Raman scattering to investigate optical properties of CdS thin films, and reveal existence of surface optical phonon (SOP) mode at 297 cm-1. Effective permittivity of mixture were modeled by Maxwell - Garnet approximation.
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Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Nonlinear Optical Materials Research
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Affiliations
Institute of Physics, Belgrade
Ain Shams University, Faculty of Education, Department of Physics, Nano-Science& Semiconductor Labs., Roxy, Cairo, Egypt
Funding
Ministry of Education, Science and Technological Development of the Republic of Serbia
References
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