In situ monitoring of microfracture during plasma spray coating by laser AE technique
Source abstract
Abstract
Atmosphere plasma spray coating materials include many pores and lamellar boundaries formed by flattened particles during spraying process although high reliability are required in ceramic coatings for turbines. These boundaries become an origin of the microcracks and following crack growth. As it is known that spraying parameters strongly affect the microstructure and strength of coating, it is expected to establish in situ monitoring technique for coating process. However, there is a limit to apply the existing non-destructive evaluation techniques to real-time monitoring at elevated temperature. We have investigated a non-contact measuring system to detect acoustic emission (AE) signals due to microfractures using a laser interferometer, and applied this technique for understanding microfracture process of ceramic coating at elevated temperature. In this paper, we evaluated the effect of several spraying parameters on the initiation and growth process of microcrack by detecting AE signals during coating process using a non-contact laser AE technique.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: High-Temperature Coating Behaviors · Nuclear Materials and Properties · Erosion and Abrasive Machining
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Materials Engineering, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-8656, Japan
Industrial Technology Center of Fukui Prefecture, Fukui city, Fukui, 910-0102, Japan
References (18)
Show source-provided references
1. 10.1007/BF0264631010.1007/BF02646310 ↗
2. 10.1016/0040-6090(84)90532-710.1016/0040-6090(84)90532-7 ↗
3. M. Arai · 2002 · 345
4. A. Ohmori · Trans. JWRI · 1990 · 19 · 259
5. 10.1016/S0257-8972(01)01433-510.1016/S0257-8972(01)01433-5 ↗
6. 10.1016/S0257-8972(01)00984-710.1016/S0257-8972(01)00984-7 ↗
7. 10.1016/S0257-8972(99)00238-810.1016/S0257-8972(99)00238-8 ↗
8. 10.1016/S0921-5093(00)00800-510.1016/S0921-5093(00)00800-5 ↗
9. Y. Sawada · Jpn. J. Nondestr. Invest. · 2002 · 51 · 392
10. 10.1361/10599630077034990810.1361/105996300770349908 ↗
11. 10.1016/0257-8972(95)02485-910.1016/0257-8972(95)02485-9 ↗
12. M. Enoki · Sci. Technol. Adv. Mater. · 2000 · 1 · 15710.1016/S1468-6996(00)00017-6 ↗
13. M. Watanabe · Sci. Technol. Adv. Mater. · 2003 · 4 · 20510.1016/S1468-6996(03)00032-9 ↗
14. 10.1016/S0921-5093(03)00394-010.1016/S0921-5093(03)00394-0 ↗
15. 10.1016/S0040-6090(97)80005-310.1016/S0040-6090(97)80005-3 ↗
16. 10.1016/S0921-5093(99)00459-110.1016/S0921-5093(99)00459-1 ↗
17. 10.2320/matertrans.45.9210.2320/matertrans.45.92 ↗
18. 10.1016/S0013-7944(01)00105-910.1016/S0013-7944(01)00105-9 ↗