journal article·1997-04

Characterisation of thin film superconducting multilayers and their interfaces using secondary ion mass spectrometry

N.J. Montgomery, J.L. MacManus-Driscoll, D.S. McPhail, B. Moeckly, K. Char

Journal of Alloys and Compounds· Volume 251· Issue 1-2
Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Ion-surface interactions and analysis · Diamond and Carbon-based Materials Research · Metal and Thin Film Mechanics

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References (7)

Show source-provided references
1. Li · Phys. Rev. B · 1995 · 51 · 8501
2. Amante · 1991 · Vol. 24 · 303
3. Beyer · 1995 · 151
4. Hofmann · Appl. Surf. Sci. · 1993 · 70/71 · 910.1016/0169-4332(93)90389-S ↗
5. Carter · Rad. Effects · 1982 · 62 · 11910.1080/00337578208222785 ↗
6. N.J. Montgomery and D.S. McPhail, Mickrochem. Acta, in press.
7. N.J. Montgomery and D.S. McPhail, Proceedings SIMS X, in press.