journal article·2022-04

GaN Power p–n Diodes on Hydride Vapor Epitaxy GaN Substrates with Near‐Unity Ideality Factor and <0.5 mΩ cm2Specific On‐Resistance

Vishank Talesara, Yuxuan Zhang, Zhaoying Chen, Hongping Zhao, Wu Lu

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Abstract

Herein, vertical GaN p–n diodes grown by metal organic chemical vapor deposition on hydride vapor epitaxy bulk GaN substrates are reported. The devices exhibit an ideality factor of 1.15, a turn‐on voltage of 3.2 V at 100 A cm−2, over 1 kV breakdown voltage, and specific on‐state resistance of 0.47 mΩ cm2, leading to a Baliga's figure of merit of ≈2.2 GW cm−2. The low specific on‐resistance, low turn‐on voltage, and the near‐unity ideality factor demonstrated here are attributed to the high epitaxial material quality and optimized low anode contact resistance.
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Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Semiconductor materials and devices · Ga2O3 and related materials

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Affiliations

Department of Electrical and Computer Engineering The Ohio State University Columbus OH 43210 USA

Department of Materials Science and Engineering The Ohio State University Columbus OH 43210 USA

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