Dichroic optical and electrical properties of rhenium dichalcogenides layer compounds

Abstract Dichroic optical and electrical behaviors of layered ReX 2 (X = S, Se) have been characterized using angular dependent polarized-absorption and resistivity measurements in the van der Waal plane. The polarized energy gaps of ReS 2 and ReSe 2 were analyzed from the polarized-absorption spectra with polarization angles from θ = 0° ( E || b -axis) to θ = 90° ( E ⊥ b -axis). The angular-dependent relationships of the polarized energy gaps of ReX 2 were analyzed. Angular dependent resistivity measurements of ReX 2 were carried out in the layer plane. The cutting edge of each sample was varied from θ = 0° (|| b ) to θ = 120° with an increment of 10° with respect to the layer crystal's b -axis. The angular dependency of the resistivities in the layered plane was analyzed. The experimental evidences of angular dependent in-plane resistivities and polarized energy gaps of ReX 2 (X = S, Se) show that for ReX 2 not only an optical dichroism but also an electrical dichroism in the van der Waal plane occurs.