Direct Observation of Local Dielectric Conductive Paths and Their Dynamics in the Degraded Multilayer Ceramic Capacitors

Scanning thermal microscopy is used to perform direct imaging local conductive path and dynamic behaviors in the degraded multilayer ceramic capacitors (MLCCs) due to the thermal conductivity difference between the dielectric layers and the conductive regions. For local conductive path, its electrical tree dynamic growth behaviors under the dc bias on and off state are clearly obtained in the thermal image. Such phenomena reveal that space–charge‐limited current mechanism dominates in local conductive path region of MLCCs. The results give a strong demonstration of scanning thermal microscopy as a powerful tool for imaging local conductive behavior in MLCCs, which provides us a direct, unique view to clarify local breakdown mechanism and enriches our insights in the insulation resistance degradation and the reliability of MLCCs.