Characterization of high‐density bit‐patterned media using ultra‐high resolution magnetic force microscopy

Abstract Bit‐patterned media at one terabit‐per‐square‐inch (Tb/in²) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)