Recent and forthcoming publications in pss: Phys. Status Solidi RRL 4/2013
Source abstract
Abstract
In this Letter, shunts caused by potential-induced degradation (PID) of crystalline solar cells are investigated in detail. Electron beam induced current measurements at low acceleration voltage reveal that PID shunts are always correlated with stacking faults in a {111} plane. Secondary ion mass spectroscopy mapping and cross-sectional high-resolution transmission electron microscopy (TEM) with EDX analyses prove that these shunting stacking faults are decorated with sodium. Accordingly, a model for PIDshunting is introduced.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Silicon and Solar Cell Technologies · solar cell performance optimization · Chemical and Physical Properties of Materials
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References
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