Absence of Partial Amorphization in GeSbTe Chalcogenide Superlattices
Source abstract
Abstract
Phase‐change materials (PCMs) are widely used for optical data storage due to their fast and reversible transitions between a crystalline and an amorphous phase that exhibit reflectivity contrast. In the last decade, PCMs have been found to be promising candidates for the development of nonvolatile electronic memories, as well. In this context, superlattices of thin layers of GeTe and Sb2Te3 show an unprecedented performance gain in terms of switching speed and power consumption with respect to bulk GeSbTe compounds. Models of crystalline–crystalline transitions, proposed to explain the improved properties, however, are challenged by recent experiments in which GeTe–Sb2Te3 superlattices are observed to reconfigure toward a van der Waals heterostructure of rhombohedral GeSbTe and Sb2Te3. Herein, ab initio molecular dynamics simulations are used to explore an alternative switching mechanism that comprises amorphous–crystalline transitions of ultrathin GeSbTe layers between crystalline Sb2Te3. Despite some positive results obtained by tailoring the quenching protocol, overall the extensive simulations do not yield clear evidence for this mechanism. Therefore, they suggest that the switching process probably involves a transition between two crystalline states.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Phase-change materials and chalcogenides · Chalcogenide Semiconductor Thin Films · Glass properties and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute for Theoretical Solid-State Physics, JARA-FIT and JARA-HPC RWTH Aachen University Aachen 52056 Germany
Funding
Deutsche Forschungsgemeinschaft
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