X‐ray topography of GdCa4O(BO3)3 single crystals grown by the Czochralski method
Source abstract
Abstract
Abstract GdCa4O(BO3)3 single crystals grown by the Czochralski technique were investigated by conventional transmission and back‐reflection X‐ray topography. The results were correlated with the growth conditions and stoichiometry of the crystals. Extended defects, especially dislocations, with different density, in samples cut perpendicular and parallel to the b‐axis were investigated. Long, straight dislocations lying perpendicular to [100] and [010] directions were observed. Periodical, small fluctuations of the diameter induced some defects. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Crystal Structures and Properties · X-ray Diffraction in Crystallography · High-pressure geophysics and materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (11)
Show source-provided references
1. 10.1021/cm00021a04410.1021/cm00021a044 ↗
2. Iliukhin A. B. · Russ. J. Inorg. Chem. · 1993 · 38 · 917
3. Aka G. · Eur. J. Solid State Inorg. Chem. · 1996 · 33 · 727
4. 10.1021/cg015540210.1021/cg0155402 ↗
5. 10.1364/JOSAB.14.00223810.1364/JOSAB.14.002238 ↗
6. Vivien D. · J. Cryst. Growth · 2002 · 621 · 237
7. 10.1016/S0960-8974(00)00008-510.1016/S0960-8974(00)00008-5 ↗
8. 10.1016/S0030-3992(00)00032-310.1016/S0030-3992(00)00032-3 ↗
9. 10.1016/j.jcrysgro.2003.10.05010.1016/j.jcrysgro.2003.10.050 ↗
10. 10.1016/j.jallcom.2004.06.00310.1016/j.jallcom.2004.06.003 ↗
11. 10.1016/j.jallcom.2005.03.08410.1016/j.jallcom.2005.03.084 ↗