DataVXphysica status solidi (a)Paper
journal article·2009-08

A synchrotron tensile test setup for nanocrystalline thin films

T. Ulyanenkova, R. Baumbusch, T. Filatova, S. Doyle, A. Castrup, P. A. Gruber, J. Markmann, J. Weissmüller, T. Baumbach, H. Hahn, O. Kraft

physica status solidi (a)· Volume 206· Issue 8
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Source abstract

Abstract

Abstract The current report covers the establishment of an in situ X‐ray diffraction tensile experiment at the synchrotron ANKA located at Forschungszentrum Karlsruhe for probing diffraction signals from nanocrystalline thin films during tensile deformation. Measurements on nanocrystalline palladium films verify the capabilities of the setup.
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Research context

Nanomaterials

OpenAlex topics: Microstructure and mechanical properties · X-ray Diffraction in Crystallography · Metallic Glasses and Amorphous Alloys

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References (4)

Show source-provided references
1. 10.1016/0001-6160(53)90006-610.1016/0001-6160(53)90006-6 ↗
2. 10.1016/j.scriptamat.2008.02.05610.1016/j.scriptamat.2008.02.056 ↗
3. J.Markmann Dissertation Universität des Saarlandes (2005).
4. 10.1063/1.216245310.1063/1.2162453 ↗