journal article·2014-06

Optical Tamm mode based refractometer in all-dielectric configuration

Ritwick Das

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Abstract

Abstract Optical Tamm (OT) modes formed at the interface of distributed-Bragg reflector (DBR) and low-index dielectric material, exhibit strong dispersive features at optical frequencies which gives rise to the possibility of designing refractometer with improved sensitivity. Using this idea, we design a TiO 2 /SiO 2 based DBR configuration for sensing refractive-index changes around 1.33 using spectral-interrogation as well as angular-interrogation method. Dispersion characteristics of OT modes in the DBR configuration are tailored to obtain spectral sensitivity ∼1200 nm/RIU and angular sensitivity ∼40°/RIU for both transverse-electric (TE) and transverse-magnetic (TM) polarizations. We also show that the sensitivity could be substantially tuned over a wide range by appropriately choosing the thicknesses of DBR constituent layer. An all-dielectric DBR configuration gives rise to the possibility of realizing refractometer in any desired spectral region by linearly translating the dispersive behavior of photonic bandgap (PBG) guided OT modes.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Photonic and Optical Devices · Plasmonic and Surface Plasmon Research · Advanced Fiber Optic Sensors

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