Optimal configuration of partial Mueller matrix polarimeter for measuring the ellipsometric parameters in the presence of Poisson shot noise and Gaussian noise
Source abstract
Abstract
Abstract We address the optimal configuration of a partial Mueller matrix polarimeter used to determine the ellipsometric parameters in the presence of additive Gaussian noise and signal-dependent shot noise. The numerical results show that, for the PSG/PSA consisting of a variable retarder and a fixed polarizer, the detection process immune to these two types of noise can be optimally composed by 121.2° retardation with a pair of azimuths ±71.34° and a 144.48° retardation with a pair of azimuths ±31.56° for four Mueller matrix elements measurement. Compared with the existing configurations, the configuration presented in this paper can effectively decrease the measurement variance and thus statistically improve the measurement precision of the ellipsometric parameters.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Optical Polarization and Ellipsometry · Leaf Properties and Growth Measurement · Remote Sensing in Agriculture
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (33)
Show source-provided references
1. Azzam · 1987
2. Goldstein · 2003
3. Tompkins · 2005
4. Application of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization10.1366/12-06883 ↗
5. Hinrichs · 2014
6. Optical, structural, and magnetic properties of cobalt nanostructure thin films10.1063/1.3138809 ↗
7. Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry10.1016/j.progsurf.2011.08.004 ↗
8. Measurement of roughness of two interfaces of a dielectric film by scattering ellipsometry10.1103/PhysRevLett.85.349 ↗
9. Complete high-frequency measurement of Mueller matrices based on a new coupled-phase modulator10.1063/1.1148178 ↗
10. Mueller matrix polarimetry with four photoelastic modulators: theory and calibration10.1364/AO.51.006805 ↗
11. Two-channel polarization modulation ellipsometer10.1364/AO.29.000959 ↗
12. Spectroscopic Mueller polarimeter based on liquid crystal devices10.1016/j.tsf.2003.12.056 ↗
13. Near infra-red Mueller matrix imaging system and application to retardance imaging of strain10.1016/j.tsf.2010.12.093 ↗
14. Optimal distribution of integration time for intensity measurements in Stokes polarimetry10.1364/OE.23.027690 ↗
15. Optimal Mueller matrix estimation in the presence of Poisson shot noise10.1364/OE.20.021331 ↗
16. Optimization of Mueller matrix polarimeters in the presence of error sources10.1364/OE.16.011589 ↗
17. Optimal distribution of integration time for intensity measurements in degree of linear polarization polarimetry10.1364/OE.24.007191 ↗
18. Well-conditioned multiple laser Mueller matrix ellipsometer10.1117/1.2957047 ↗
19. Noise reduction in a laser polarimeter based on discrete waveplate rotations
20. Ellipsometry with randomly varying polarization states10.1364/OE.20.000870 ↗
21. Simplified calibration procedure for Mueller polarimeter in transmission configuration10.1364/OL.39.000418 ↗
22. Optimized Mueller polarimeter with liquid crystals10.1364/OL.28.000616 ↗
23. Mueller-matrix ellipsometry using the division-of-amplitude photopolarimeter: a study of depolarization effects10.1364/AO.33.004184 ↗
24. Optimization and structuring of the instrument matrix for polarimetric measurements10.1117/1.1467361 ↗
25. Performance of Maximum Likelihood estimation of Mueller matrices taking into account physical realizability and Gaussian or Poisson noise statistics10.1364/OE.21.005117 ↗
26. Design and optimization of partial Mueller matrix polarimeters10.1364/AO.49.002326 ↗
27. Optimal configurations of full-Stokes polarimeter with immunity to both Poisson and Gaussian noise10.1088/2040-8978/18/5/055702 ↗
28. General and self-consistent method for the calibration of polarization modulators, polarimeters, and mueller-matrix ellipsometers10.1364/AO.38.003490 ↗
29. Angle-resolved Mueller polarimeter using a micro- scope objective10.1002/pssa.200777806 ↗
30. Optimization of instrument matrix for Mueller matrix ellipsometry based on partial elements analysis of the Mueller matrix10.1364/OE.25.018872 ↗
31. Optimum angles for a polarimeter: I10.1117/12.202093 ↗
32. Demonstration of a snapshot full-Stokes division-of aperture imaging polarimeter using Wollaston prism array10.1088/2040-8978/17/12/125708 ↗
33. Optimization of retardance for a complete Stokes polarimeter10.1364/OL.25.000802 ↗