Non-dissociation of Lomer–Cottrell dislocations and 〈110〉{001} slip in silicon
Source abstract
Abstract
Abstract Two unexpected features have been revealed by transmission electron microscopy investigations of deformed silicon bicrystals: (a) slip of a/2 〈110〉 dislocations on {001} planes and (b) non-dissociation of Lomer–Cottrell dislocations formed by intersecting slip dislocations.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Microstructure and mechanical properties · Silicon and Solar Cell Technologies · Force Microscopy Techniques and Applications
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References (8)
Show source-provided references
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