Regression-based detection of missing boundaries in multiphase polycrystalline microstructures
Source abstract
Abstract
An efficient alternative approach for detecting missing boundaries in micrographs is presented in the current work.By treating the missing boundaries as a class of object, a suitable detection algorithm is extended to realise discontinuities in interfaces separating phases and grains.The metrics, including precision and recall, estimated during the development of the model indicate noteworthy performance.Moreover, a direct comparison with actual situations attests to the accuracy of the current approach in detecting missing boundaries across different multiphase polycrystalline micrographs.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Industrial Vision Systems and Defect Detection · Mineral Processing and Grinding · Cultural Heritage Materials Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Theoretical Metallurgy Group, Department of Metallurgical and Materials Engineering, National Institute of Technology, Tiruchirappalli, India
Institute of Applied Materials (IAM-MMS), Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany
Funding
Science & Engineering Research Board
References (23)
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