Lattice images of ZnSe crystals

Abstract Using a 300 kV transmission electron microscope, lattice images of ZnSe projected on the (110) plane have been obtained. A detailed comparison between experimental and simulated images is made. The traditional simulation obtained by the superposition of free-atom potentials does not provide a fit to the elongation of close spots corresponding to adjacent columns of zinc and selenium atoms. It is also found that the difference in spot intensities for a through-focus series is not completely reproduced from such calculations. These deviations from experiment can be remedied by taking account of screening by valence-charge electrons.