Platelet copper precipitates in silicon: A high-resolution electron microscopy study
Source abstract
Abstract
Abstract A new shape of copper precipitates in silicon has been observed to form after a heat treatment with rapid cooling. Its structure and epitaxial relationship have been determined by high-resolution electron microscopy. The influence of the experimental conditions (cooling rate and dislocation density) on the appearance of this kind of precipitate is discussed.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis · Thin-Film Transistor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (14)
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