Epitaxial decagonal thin films on crystalline substrates

Al-Cu-Fe-Cr quasicrystalline thin films were grown on atomically flat Al 2 O 3 sapphire (0001) substrates by single-target magnetron sputtering followed by annealing. A decagonal phase with the tenfold axis A 10 parallel to the substrate surface normal was observed. The epitaxial decagonal film had two different unique orientations: a twofold P axis A 2P and a twofold D axis A 2D parallel to of the substrate. These two configurations were explained using a coincidence reciprocal lattice planes model for the interface energy. We show that this classic approach for crystal-crystal epitaxy can be applied to quasicrystal-crystal systems.