The development and early applications of the weak-beam technique
Source abstract
Abstract
Abstract\n A short review is given of the way the weak-beam technique for observing dislocations at higher resolution than previously attained was developed, and some of the early applications.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Microstructure and mechanical properties · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (28)
Show source-provided references
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