Interaction force measurements using atomic force microscopy for characterization and control of adhesion, dispersion and lubrication in particulate systems

Abstract Atomic force microscopy is used as a vital tool in understanding the fundamental mechanisms of particulate processes in dry, humid and aqueous systems. Adhesion forces in both dry and humid systems were studied between surfaces of varying roughness, taking into account the capillary forces at high humidity conditions. Colloidal stability in aqueous systems due to non-DLVO forces and steric effects of surfactant aggregates formed on particle surfaces at varying pH and ionic strength conditions were investigated. The force–distance curves obtained by atomic force microscopy were used to determine the mechanical and thermodynamic properties of the self-assembled surfactant structures formed on the surface. Besides determining the repulsive force barrier provided by the surfactant aggregates in dispersion of slurries, the frictional interactions between surfactant adsorbed surfaces were measured using lateral force microscopy, providing valuable insights into the role of dispersants acting as lubricants. The range of interaction forces that can be explored using the Atomic Force Microscopy (AFM) can be utilized to predict, optimize and design a variety of industrially relevant processes such as chemical mechanical polishing (CMP), powder flow and handling and nano-dispersions, just to name a few. Keywords: ADHESIONATOMIC FORCE MICROSCOPYNANOSCALE ROUGHNESSCAPILLARY FORCEFRICTION FORCENANOTRIBOLOGYSURFACTANTCOLLOID STABILITY