Application of Two‐Dimensional Detectors in X‐ray Diffraction Materials Structure Analysis
Source abstract
Abstract
Abstract The examination of the azimuthal (lateral) diffraction line profile, i.e., the size, number and shape of individual diffraction spots of which discontinuous diffraction line consist, often reveals useful information on the material's structure which cannot be obtained by the application of other analytical techniques. The information obtained can be advantageously used in the development and optimization of technological processes as well as for monitoring of processes which degrade the material's structure during their use.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: X-ray Diffraction in Crystallography
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (10)
Show source-provided references
1. 10.1126/science.110.2858.36810.1126/science.110.2858.368 ↗
2. J. Fiala R. L. Snyder Introduction to Defect and Microstructure Analysis or the Analysis of Real Structure inDefect and Microstructure Analysis by Diffraction(Eds.: R. L. Snyder J. Fiala H. J. Bunge) Oxford University Press New York 1999 pp. 1–15.10.1093/oso/9780198501893.003.0001 ↗
3. B. J. Pines Fine‐focus X‐ray Tubes and Applied X‐ray Diffraction Analysis(in Russian). GITTL Moscow 1955 pp. 175–182.
4. 10.1016/0146-3535(89)90028-210.1016/0146-3535(89)90028-2 ↗
5. K. W. Andrews The Interpretation of Non‐continuous Diffraction Rings inX‐ray Diffraction by Polycrystalline Materials(Eds.: H. S. Peiser H. P. Rooksby A. J. C. Wilson) The Institute of Physics London 1955 pp. 454–461.
6. X‐ray Diffraction Imaging as a Tool of Mesostructure Analysis.
7. Industrial Applications of X‐ray Diffraction Imaging for Nondestructive Testing.
8. X‐ray Diffraction Monitoring of Structural Degradation.
9. 10.1524/zkri.1989.189.1-2.9510.1524/zkri.1989.189.1-2.95 ↗
10. Röntgenographische Polfigurmessung mit dem Flächendetektor.