Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution
Source abstract
Abstract
Liquid structures on solid substrates have been imaged with a resolution in the nanometer range by scanning force microscopy in the tapping mode. Using Substrates with an artificially patterned wettability, characteristic features in the three-phase contact line were induced, which allow the contact line tension to be determined. The values in the range of -1 x 10-10 N obtained for sessile droplets of hexaethylene glycol arc consistent with theoretical predictions.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Adhesion, Friction, and Surface Interactions · Surface Modification and Superhydrophobicity · Electrical Contact Performance and Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (26)
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